EEEF Module for InSight | MITUTOYO

Описание

Extended FocusWith the EEEF module added to InSight Basic, it is possible to capture images with“Super depth of field”, by capturing images at different focal planes, and then use an algorithm to find theoptimal focused parts in each image, and then combine these parts from differentimages to form one image perfectly focused everywhere. The algorithm in DeltaPix InSight also compensatesfor any change in magnification or image shift in stereo microscopes.Extended ExposureThe EEEF module includes a state of the art Extended Exposure function. Extended Exposurefunction can combine images at different exposure times and combines the images into onesingle image with perfect exposure.